Scanning Electron Microscope: Pt 1 of 6
June 29th, 2010 | by admin |
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 1 of a 6-part series, and gives a tour of the device, and describes how to prepare a sample.
More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/mediawiki/index.php?title=Scanning_Electron_Microscope
Duration : 0:8:44
3 Responses to “Scanning Electron Microscope: Pt 1 of 6”
By cespedeslv on Jun 29, 2010 | Reply
@cmditr Thanks! Dude
@cmditr Thanks! Dude
By cmditr on Jun 29, 2010 | Reply
@cespedeslv
The …
@cespedeslv
The SEM can be used with ebeam lithography to make simple prototype devices. It is not used for mass production because it is slow and complicated.
By cespedeslv on Jun 29, 2010 | Reply
Can you use the SEM …
Can you use the SEM to make smaller, more energy efficient, and powerful CPUs or denser SSDs?